Laboratory and Measuring and Observing and Testing Equipment
1 - 7 of 7 listingsEuropean and Premium listings
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Ostrich Skins Salted And CrustLive animals - Italservice sas - Italy - March 29, 2024 - contact company for price
Dear Sir We are an italian firm and we can sell salted ostrich skins and ostrich leather in crust on a regular basis at competitive prices. We have good quality skins and we can sell worldwide. We also have ostrich's legs skins If you are interested ...
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Die Face Cutter L1300Extrusions - Sollex AB - Sweden - March 21, 2024 - 500.00 Dollar US$
Pellet knife or Die Face Cutter L1300 in extreme tooling steel. Very durable die face cutter. Sollex Die face cutter is perfect for plastic film and foil production. The blade shreds material in your recycling machine.
Laboratory and Measuring and Observing and Testing Equipment Hong Kong List By Date Descendingly - ECeurope Market
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Semiconductor Test Probe Scpa025 For Chip InspectionMeasuring and observing and testing instruments - Centalic Technology Development Ltd. - Hong Kong - December 6, 2022 - contact company for price
Pogo Pin Semiconductor Test Probe SCPA025 Series for IC Test Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the require...
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Semiconductor Test Probe Pogo Pin Scfe035 For Integrated Circuit InspectionMeasuring and observing and testing instruments - Centalic Technology Development Ltd. - Hong Kong - December 1, 2022 - contact company for price
Semiconductor Test Probe Pogo Pin SCFE035 for Integrated Circuit Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, howev...
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Double Ended Pogo Pin Test Probe Scfb029 40 For Chip InspectionMeasuring and observing and testing instruments - Centalic Technology Development Ltd. - Hong Kong - November 25, 2022 - contact company for price
Double-Ended Pogo Pin Test Probe SCFB029 (40) for Chip Inspection Its parameters are as below. Materials (plated) Barrel: Ph, Au on Ni Plated Bottom Plunger: BeCu, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Ele...
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Double Ended Pogo Pin Test Probe Scpc026 For Integrated Circuit InspectionMeasuring and observing and testing instruments - Centalic Technology Development Ltd. - Hong Kong - November 22, 2022 - contact company for price
Double-ended Pogo Pin Test Probe SCPC026 for Integrated Circuit Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, howeve...
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Test Probe Pogo Pin Scpa020 For Integrated Circuit InspectionMeasuring and observing and testing instruments - Centalic Technology Development Ltd. - Hong Kong - November 16, 2022 - contact company for price
Test Probe Pogo Pin SCPA020 for Integrated Circuit Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requir...
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Semiconductor Test Probe Double Ended Pogo Pin Scpe015 For Ic InspectionMeasuring and observing and testing instruments - Centalic Technology Development Ltd. - Hong Kong - September 17, 2022 - contact company for price
Semiconductor Test Probe Double-ended Pogo Pin SCPE015 for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however,...
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Yoshida Seiki Shock Tester Asq SeriesLaboratory and scientific equipment - Honest Industrial Products Co., Ltd. - Hong Kong - September 6, 2016 - check with company for price
China Yoshida Seiki Shock Tester Supplier Honest provides Yoshida Seiki Shock Testers, generation of Trapezoidal Pulse and Half-sine Pulse. Yoshida Seiki (SHINYEI) Automatic (Square)Drop Shock Tester / Shock Machine ASQ Series Fragility testing for m...
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