Laboratory and Measuring and Observing and Testing Equipment

European and Premium listings

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  Sollex Industrial Craft Blade Pro 2pluss

  Industrial process machinery - Sollex AB - Sweden - April 18, 2024 - 100.00 Dollar US$

  Sollex Craft Blades 2+S for Professional Users The industrial blade, or as we actually call it the industrial blade 2+S, has been Sollex's faithful servant for many years. The professional blade 2pluS is optimized for the professional craftsman who d...

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  Machine Knife 50pcs 105x28mm To Cut Abrasive Materials

  Industrial process machinery - Sollex AB - Sweden - April 18, 2024 - 700.00 Dollar US$

  105x28x2mm holes Ø9mm – quality steel – hardness 60–61HRC – for cutting trough material e.g. sand, asphalt and bitumen inline Sollex nachine knife to cut abrasive materials - Extra sharp Knife for cross-cutting tough material of sand, asphalt and bit...

Laboratory and Measuring and Observing and Testing Equipment Hong Kong List By Price Descendingly - ECeurope Market

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  Yoshida Seiki Shock Tester Asq Series

  Laboratory and scientific equipment - Honest Industrial Products Co., Ltd. - Hong Kong - September 6, 2016 - check with company for price

  China Yoshida Seiki Shock Tester Supplier Honest provides Yoshida Seiki Shock Testers, generation of Trapezoidal Pulse and Half-sine Pulse. Yoshida Seiki (SHINYEI) Automatic (Square)Drop Shock Tester / Shock Machine ASQ Series Fragility testing for m...

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  Semiconductor Test Probe Pogo Pin Scfe035 For Integrated Circuit Inspection

  Measuring and observing and testing instruments - Centalic Technology Development Ltd. - Hong Kong - December 1, 2022 - contact company for price

  Semiconductor Test Probe Pogo Pin SCFE035 for Integrated Circuit Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, howev...

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  Double Ended Pogo Pin Test Probe Scpc026 For Integrated Circuit Inspection

  Measuring and observing and testing instruments - Centalic Technology Development Ltd. - Hong Kong - November 22, 2022 - contact company for price

  Double-ended Pogo Pin Test Probe SCPC026 for Integrated Circuit Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, howeve...

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  Semiconductor Test Probe Double Ended Pogo Pin Scpe015 For Ic Inspection

  Measuring and observing and testing instruments - Centalic Technology Development Ltd. - Hong Kong - September 17, 2022 - contact company for price

  Semiconductor Test Probe Double-ended Pogo Pin SCPE015 for IC Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however,...

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  Semiconductor Test Probe Scpa025 For Chip Inspection

  Measuring and observing and testing instruments - Centalic Technology Development Ltd. - Hong Kong - December 6, 2022 - contact company for price

  Pogo Pin Semiconductor Test Probe SCPA025 Series for IC Test Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the require...

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  Double Ended Pogo Pin Test Probe Scfb029 40 For Chip Inspection

  Measuring and observing and testing instruments - Centalic Technology Development Ltd. - Hong Kong - November 25, 2022 - contact company for price

  Double-Ended Pogo Pin Test Probe SCFB029 (40) for Chip Inspection Its parameters are as below. Materials (plated) Barrel: Ph, Au on Ni Plated Bottom Plunger: BeCu, Au on Ni Plated Top Plunger: SK4, Au on Ni Plated Spring: SWP-A/B, Au on Ni Plated Ele...




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  Test Probe Pogo Pin Scpa020 For Integrated Circuit Inspection

  Measuring and observing and testing instruments - Centalic Technology Development Ltd. - Hong Kong - November 16, 2022 - contact company for price

  Test Probe Pogo Pin SCPA020 for Integrated Circuit Inspection Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requir...